Published July 15, 2008
| Version v1
Journal article
Infrared optical properties of Ba(Zr0.20Ti0.80)O3 and Ba(Zr0.30Ti0.70)O3 thin films prepared by sol-gel method
- 1. Department of Physics Shanghai Normal University, 100 Gui Lin Road, Shanghai 200234 (China) and National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yutian Road, Shanghai 200083 (China)
- 2. National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yutian Road, Shanghai 200083 (China)
Description
Ba(ZrxTi1-x)O3 (BZT) (x = 0.20 and 0.30) thin films are deposited on Pt(1 1 1)/Ti/SiO2/Si(1 0 0) substrate by sol-gel method. X-ray diffraction patterns show that the thin films have a good crystallinity. Optical properties of the films in the wavelength range of 2.5-12 μm are studied by infrared spectroscopic ellipsometry (IRSE). The optical constants of the BZT thin films are determined by fitting the IRSE data using a classical dispersion formula. As the wavelength increases, the refractive index decreases, while the extinction coefficients increase. The effective static ionic charges are derived, which are smaller than that in a purely ionic material for the BZT thin films
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2008.03.178Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2008.03.178;
- PII
- S0169-4332(08)00402-9;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 254
- Journal Issue
- 18
- Journal Page Range
- p. 5660-5663
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40032065
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BARIUM COMPOUNDS; DISPERSIONS; ELLIPSOMETRY; INFRARED SPECTRA; OXIDES; PLATINUM; REFRACTIVE INDEX; SILICON OXIDES; SOL-GEL PROCESS; THIN FILMS; TITANIUM COMPOUNDS; X-RAY DIFFRACTION; ZIRCONIUM COMPOUNDS
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELEMENTS; FILMS; MEASURING METHODS; METALS; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; PLATINUM METALS; SCATTERING; SILICON COMPOUNDS; SPECTRA; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.