Nanoheteroepitaxy of gallium arsenide on strain-compliant silicon-germanium nanowires
Creators
- 1. Department of Electrical and Computer Engineering, National University of Singapore (NUS), Singapore 117576 (Singapore)
- 2. School of Electrical and Electronic Engineering, Nanyang Technological University (NTU), Nanyang Avenue, Singapore 639798 (Singapore)
- 3. Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University (NTU), Singapore 637371 (Singapore)
Description
Heterogeneous integration of high-quality GaAs on Si-based substrates using a selective migration-enhanced epitaxy (MEE) of GaAs on strain-compliant SiGe nanowires was demonstrated for the first time. The physics of compliance in nanoscale heterostructures was captured and studied using finite-element simulation. It is shown that nanostructures can provide additional substrate compliance for strain relief and therefore contribute to the formation of defect-free GaAs on SiGe. Extensive characterization using scanning electron microscopy and cross-sectional transmission electron microscopy was performed to illustrate the successful growth of GaAs on SiGe nanowire. Raman and Auger electron spectroscopy measurements further confirmed the quality of the GaAs grown and the high growth selectivity of the MEE process.
Additional details
Identifiers
- DOI
- 10.1063/1.3465327;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 108
- Journal Issue
- 2
- Journal Page Range
- p. 024312-024312.5
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42069799
- Subject category
- S36: MATERIALS SCIENCE; S77: NANOSCIENCE AND NANOTECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AUGER ELECTRON SPECTROSCOPY; CRYSTAL GROWTH; FINITE ELEMENT METHOD; GALLIUM ARSENIDES; GERMANIUM; GERMANIUM SILICIDES; HETEROJUNCTIONS; LAYERS; MOLECULAR BEAM EPITAXY; QUANTUM WIRES; RAMAN SPECTRA; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; SILICON; STRAINS; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; CALCULATION METHODS; CRYSTAL GROWTH METHODS; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; EPITAXY; GALLIUM COMPOUNDS; GERMANIUM COMPOUNDS; MATERIALS; MATHEMATICAL SOLUTIONS; METALS; MICROSCOPY; NANOSTRUCTURES; NUMERICAL SOLUTION; PNICTIDES; SEMICONDUCTOR JUNCTIONS; SEMIMETALS; SILICIDES; SILICON COMPOUNDS; SPECTRA; SPECTROSCOPY
Optional Information
- Notes
- (c) 2010 American Institute of Physics