Published September 1, 1997
| Version v1
Journal article
Core level spectroscopy for surface analysis
Creators
- Himpsel, Franz J.
- Treusch, Rolf
- Jimenez Guerrero, Ignacio
- Jankowski, Alan
- Sutherland, Douglas G.
- Terminello, Louis J.
- Heske, Clemens
- Perera, Rupert C.C.
- Shuh, David K.
- Tong, William M.
- Underwood, James H.
- Carlisle, John A.
- Callcott, Thomas A.
- Jia, Jianjun
- Ederer, David L.
- Gruen, D.M.
- Krauss, A.R.
- Zuiker, D.C.
- Doll, G.L.
- Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (United States)
Description
no abstract available
Additional details
Publishing Information
- Journal Title
- Critical Reviews of Optical Science and Technology
- Journal Volume
- CR
- Journal Issue
- 69
- Journal Page Range
- [10 p.]
- ISSN
- 1018-1997
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 33063792
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; EMISSION SPECTROSCOPY; SURFACE AREA; SURFACE PROPERTIES; X-RAY SPECTROSCOPY
- Descriptors DEC
- SPECTROSCOPY; SURFACE PROPERTIES
Optional Information
- Contract/Grant/Project number
- AC03-76SF00098
- Notes
- Journal Publication Date: September 1997
- Funding organization
- US Department of Energy (United States)
- Secondary number(s)
- LBNL/ALS--815