Materials evaluation by Spring-8

The fundamental property of X-ray is light, so that, some measurement examples are explained by interference, diffraction, scattering, spectrum and image pickup. The characteristics of synchrotron radiation were explained. For examples, X-ray reflectivity curve of 1 nm SiO2 film, spin bulb structure of Si/Ta(5)/NiFe(4)/CoFeB(2)/Cu(2)/CoFeB(2)/PdPtMn(25)/Ta(5) by Giant Magnetic Resistance (GMR), the electronic density distribution of MgH2(001) and (110) by Maximum Enthalpy Method (MEM), identification of crystal of Telmisartan, reaction of Fe and Zn and in-situ observation of it, X-ray Crystal Truncation Rod (CTR) diffraction of SiON/Si interface, lattice displacement and leak current of SiON/Si interface, lamella structure of keratin, In composition of GaInN by XAFS (X-ray Absorption Fine Structure) spectrum, XANES (X-ray Absorption Near Edge Structure) spectrum of BaMgAlO17:Eu, which is blue fluorescent material, and a refraction contrast method are reported. (S.Y.)