Published 1971
| Version v1
Report
Open
Trace element analysis by charged particle induced characteristic x-rays
Description
no abstract available
Availability note (English)
MF available from INIS under the Report Number.Files
3020264.pdf
Files
(448.0 kB)
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Additional details
Publishing Information
- Imprint Pagination
- p. 17.1-17.9.
- Report number
- INIS-mf--266
Conference
- Title
- International meeting on chemical analysis by charged particle bombardment.
- Dates
- 6 Sep 1971.
- Place
- Namur, Belgium.
INIS
- Country of Publication
- Belgium
- Country of Input or Organization
- Belgium
- INIS RN
- 3020264
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALPHA BEAMS; MEV RANGE; PROTON BEAMS; TARGETS; TRACE AMOUNTS; X RADIATION
- Descriptors DEC
- BEAMS; ELECTROMAGNETIC RADIATION; ENERGY RANGE; ION BEAMS; PARTICLE BEAMS; RADIATIONS
Optional Information
- Notes
- Pre-conference paper.