Annealing effects on microstructural, optical, and mechanical properties of sputtered CrN thin film coatings: Experimental studies and finite element modeling
Creators
- 1. Karbala Technical Institute, Al-Furat Al-Awsat Technical University, Karbala 56001 (Iraq)
- 2. Surface Analysis and Materials Engineering Research Group, School of Engineering & Information Technology, Murdoch University, Perth, WA 6150 (Australia)
- 3. Department of Physics, Jahangirnagar University, Savar, Dhaka 1342 (Bangladesh)
- 4. School of Engineering, Edith Cowan University, Joondalup, WA 6027 (Australia)
- 5. John de Laeter Centre, Curtin University, Perth, WA 6102 (Australia)
- 6. Department of Mechanical and Biomedical Engineering, City University of Hong Kong, Kowloon, Hong Kong (China)
- 7. Department of Chemical and Metallurgical Engineering & Chemistry, School of Engineering & Information Technology, Murdoch University, Perth, WA 6150 (Australia)
Description
Highlights: • Influence of annealing temperatures on microstructural, optical and mechanical properties of CrN coatings were investigated. • Lattice micorstrains and residual stress values of these coatings were reduced with the rise in annealing temperatures. • Energy band-gaps of CrN coatings were linearly decreased with the rise in annealing up to 700° C. • Stress level around the coatings were changed when different types of substrates were used. Chromium nitride (CrN) coatings were deposited by magnetron sputtering onto Si(100) substrates. The coatings were then annealed at different temperatures (500–800 °C in steps of 100 °C) in air for 1 h. X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM), X-ray photoelectron spectroscopy (XPS), UV–Vis spectroscopy, nanoindentation tests and finite element modeling (FEM) were conducted in order to investigate their structural, morphological, optical and mechanical properties. XRD patterns show that the crystallinity of the CrN phase increases with the rise in annealing temperatures together with its preferred orientations along (111) and (200) diffraction planes. The lattice constants were slightly reduced from 4.19 to 4.11 nm at 800 °C. The lattice micorstrains and residual stresses were also reduced as the annealing temperatures rose as a result of reduced defects, dislocations and vacancies. Smooth grain-like surfaces with grain sizes ranging between ∼50 and 250 nm were confirmed by FESEM micrographs. XPS studies indicated the existence of Cr and N on the coating systems. Optical studies showed that with the rise in annealing temperature of up to 700 °C, the solar absorptance of CrN coatings is increased from 61% to 89% and slightly decreased at 800 °C, while the optical band-gap energy dropped from 2.62 to 1.38 eV and slightly increased to 1.48 eV at 800 °C. A gradual increase of dielectric constants of CrN films were realized with the subsequent annealing progression. Nanoindentation results indicated that as the annealing progresses, the hardness and elastic modulus values are lowered.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2018.04.012Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2018.04.012;
- PII
- S0925838818312921;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 750
- Journal Page Range
- p. 451-464
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53080437
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- FIELD EMISSION; FINITE ELEMENT METHOD; GRAIN ORIENTATION; GRAIN SIZE; HARDNESS; RESIDUAL STRESSES; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CALCULATION METHODS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; EMISSION; FILMS; MATHEMATICAL SOLUTIONS; MECHANICAL PROPERTIES; MICROSCOPY; MICROSTRUCTURE; NUMERICAL SOLUTION; ORIENTATION; PHOTOELECTRON SPECTROSCOPY; SCATTERING; SIZE; SPECTROSCOPY; STRESSES
Optional Information
- Copyright
- Copyright (c) 2018 Elsevier B.V. All rights reserved.