Published May 11, 2013 | Version v1
Journal article Metadata-only

Novel approaches in the SR beamline design

Creators

  • 1. Photon Science Directorates, Brookhaven National Laboratory, Upton, NY 11973-5000 (United States)

Description

High brightness third generation x-ray sources bring new experimental possibilities and impose new challenges. Coherent scattering and diffraction-limited microscopy require wave-preserving optics, high-resolution inelastic scattering novel optical elements, where x-ray interferometry or the requirements of precise polarization measurements change the optical layout. With NSLS-II development as an illustration we discuss recent trends in beamline design

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2012.11.090

Additional details

Identifiers

DOI
10.1016/j.nima.2012.11.090;
PII
S0168-9002(12)01437-4;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
710
Journal Page Range
p. 161-165
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
4. international workshop on metrology for X-ray optics, mirror design, and fabrication
Dates
4-6 Jul 2012
Place
Barcelona (Spain)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45047666
Subject category
S43: PARTICLE ACCELERATORS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM TRANSPORT; BRIGHTNESS; DESIGN; DIFFRACTION; INELASTIC SCATTERING; INTERFEROMETRY; MICROSCOPY; NSLS; PHOTON BEAMS; POLARIZATION; RESOLUTION; SYNCHROTRON RADIATION; X RADIATION; X-RAY SOURCES
Descriptors DEC
BEAMS; BREMSSTRAHLUNG; COHERENT SCATTERING; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATION SOURCES; RADIATIONS; SCATTERING; SYNCHROTRON RADIATION SOURCES

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.