Published March 1, 2009 | Version v1
Journal article

In-situ TEM and ion irradiation of ferritic materials

Description

The intermediate voltage electron microscope-tandem user facility in the Electron Microscopy Center at Argonne National Laboratory is described. The primary purpose of this facility is electron microscopy with in situ ion irradiation at controlled sample temperatures. To illustrate its capabilities and advantages a few results of two outside user projects are presented. The motion of dislocation loops formed during ion irradiation is illustrated in video data that reveals a striking reduction of motion in Fe-8%Cr over that in pure Fe. The development of extended defect structure is then shown to depend on this motion and the influence of nearby surfaces in the transmission electron microscopy thin samples. In a second project, the damage microstructure is followed to high dose (200 dpa) in an oxide dispersion strengthened ferritic alloy at 500 C, and found to be qualitatively similar to that observed in the same alloy neutron irradiated at 420 C.

Additional details

Identifiers

Publishing Information

Journal Title
Microscopy Research and Technique
Journal Volume
72
Journal Issue
3
Journal Page Range
p. 182-186
ISSN
1059-910X

Optional Information

Contract/Grant/Project number
AC02-06CH11357
Notes
doi 10.1002/jemt.20670
Funding organization
USDOE Office of Science (United States); UK Atomic Energy Authority (United Kingdom)
Secondary number(s)
ANL/MSD/JA--62258