Published 1981
| Version v1
Journal article
Application of Secondary Ion Mass Spectrometry in corrosion research
Creators
- 1. Eoetvoes Lorand Tudomanyegyetem, Budapest (Hungary). Fizikai Kemiai es Radiologiai Tanszek
Description
An analytical method, the Secundary Ion Mass Spectrometry (SIMS) and its application in corrosion research are dealt with. Ion bombardment, secundary ion emission, the SIMS equipment and its possibilities in elemental and isotope analysis together with the determination of the distribution of the elements in the function of their depth from the surface are treated. A few examples illustrating the recent progress in corrosion research by SIMS are given. (Sz.J.)
Additional details
Additional titles
- Original title (Hungarian)
- A szekunder ion toemegspektrometria alkalmazasa a korrozios kutatasokban
Publishing Information
- Journal Title
- Korroz. Figy.
- Journal Volume
- 21
- Journal Issue
- 1
- Series
- Korroz. Figy.
- Journal Page Range
- 3-8
- ISSN
- 0133-2546
INIS
- Country of Publication
- Hungary
- Country of Input or Organization
- Hungary
- INIS RN
- 12634464
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- CORROSION; DEPTH; ION BEAMS; KEV RANGE 01-10; MASS SPECTROSCOPY; SECONDARY EMISSION; SPATIAL DISTRIBUTION; SPUTTERING; SURFACES; USES
- Descriptors DEC
- BEAMS; CHEMICAL REACTIONS; DIMENSIONS; DISTRIBUTION; EMISSION; ENERGY RANGE; KEV RANGE; SPECTROSCOPY
Optional Information
- Notes
- 40 refs.