Published June 2005 | Version v1
Journal article

Photoluminescence of zirconia films with VUV excitation

  • 1. National Synchrotron Radiation Research Center, 101 Hsin-Ann Road, Hsinchu Science Park, Hsinchu 30076, Taiwan (China)
  • 2. Department of Nuclear Science, National Tsing Hua University, Hsinchu 30013, Taiwan (China)
  • 3. Department of Radiological Technology, Yuanpei Institute of Science and Technology, Hsinchu 30015, Taiwan (China)

Description

Using synchrotron radiation as a source of VUV excitation, we examined the photoluminescence (PL) of zirconia (ZrO2) films prepared from zirconium propoxide by the sol-gel method at high temperature. X-ray diffraction (XRD) results reveal that ZrO2 films exhibit tetragonal, a mixture of tetragonal and monoclinic, and monoclinic phases at heating temperatures 700, 900 and 1100 deg. C, respectively. Upon VUV excitation, PL of a ZrO2 film in the tetragonal phase has a maximum at 390 nm, for which excitation is most efficient at 164 nm, near the energy gap of the tetragonal phase. PL emission in the monoclinic phase is characterized by a distinctive band at 475 nm, for which excitation is most efficient at 235 nm, near the energy gap of the monoclinic phase

Additional details

Identifiers

DOI
10.1016/j.elspec.2005.01.222;
PII
S0368-2048(05)00276-8;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
144-147
Journal Page Range
p. 865-868
ISSN
0368-2048
CODEN
JESRAW

Conference

Title
14. international conference on vacuum ultraviolet radiation physics
Acronym
VUV 14
Dates
19-23 Jul 2004
Place
Cairns (Australia)

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.