Neutron reflection to probe surface and interface segregation of polymers
Description
Neutron reflectivity has been used to study the surface and interface segregation profiles of model polymer blends, consisting of deuterated and protonated polymers of high molecular weight. In this paper the authors discuss the factors involved in achieving an optimum experimental design, including the choice of substrate material and the label for the segregating species. The authors have found that neutron reflection is most useful when combined with a lower resolution, but direct, depth profiling technique, such as forward recoil spectrometry (FRES) or secondary ion mass spectrometry (SIMS). The direct profiling technique may be used to give a rough model of the profile, including integral measures of the segregation which constrain the possible profiles. A constrained profile can then be refined using the neutron reflectivity data. They discuss the principles of their experimental design and illustrate these with examples from their recent experiments
Additional details
Publishing Information
- Publisher
- American Chemical Society.
- Imprint Place
- Washington, DC (United States)
- Imprint Title
- American Chemical Society. Division of Polymer Chemistry, Inc.
- Imprint Pagination
- 124 p.
- Journal Page Range
- p. 3, Paper POLY 27.
Conference
- Title
- 200. American Chemical Society (ACS) national meeting.
- Dates
- 26-31 Aug 1990.
- Place
- Washington, DC (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23081398
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DEUTERATION; INTERFACES; MASS SPECTROSCOPY; MIXING; MOLECULAR WEIGHT; NEUTRON DIFFRACTION; NEUTRONS; POLYMERS; REFLECTION; SEGREGATION; SURFACE PROPERTIES
- Descriptors DEC
- BARYONS; CHEMICAL REACTIONS; COHERENT SCATTERING; DIFFRACTION; ELEMENTARY PARTICLES; FERMIONS; HADRONS; NUCLEONS; SCATTERING; SPECTROSCOPY
Optional Information
- Secondary number(s)
- CONF-900802--.