Published 1990 | Version v1
Book

Neutron reflection to probe surface and interface segregation of polymers

  • 1. Cornell Univ., Ithaca, NY (United States)

Description

Neutron reflectivity has been used to study the surface and interface segregation profiles of model polymer blends, consisting of deuterated and protonated polymers of high molecular weight. In this paper the authors discuss the factors involved in achieving an optimum experimental design, including the choice of substrate material and the label for the segregating species. The authors have found that neutron reflection is most useful when combined with a lower resolution, but direct, depth profiling technique, such as forward recoil spectrometry (FRES) or secondary ion mass spectrometry (SIMS). The direct profiling technique may be used to give a rough model of the profile, including integral measures of the segregation which constrain the possible profiles. A constrained profile can then be refined using the neutron reflectivity data. They discuss the principles of their experimental design and illustrate these with examples from their recent experiments

Additional details

Publishing Information

Publisher
American Chemical Society.
Imprint Place
Washington, DC (United States)
Imprint Title
American Chemical Society. Division of Polymer Chemistry, Inc.
Imprint Pagination
124 p.
Journal Page Range
p. 3, Paper POLY 27.

Conference

Title
200. American Chemical Society (ACS) national meeting.
Dates
26-31 Aug 1990.
Place
Washington, DC (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
23081398
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DEUTERATION; INTERFACES; MASS SPECTROSCOPY; MIXING; MOLECULAR WEIGHT; NEUTRON DIFFRACTION; NEUTRONS; POLYMERS; REFLECTION; SEGREGATION; SURFACE PROPERTIES
Descriptors DEC
BARYONS; CHEMICAL REACTIONS; COHERENT SCATTERING; DIFFRACTION; ELEMENTARY PARTICLES; FERMIONS; HADRONS; NUCLEONS; SCATTERING; SPECTROSCOPY

Optional Information

Secondary number(s)
CONF-900802--.