Published October 18, 2004
| Version v1
Journal article
Growth and optical properties of Ge oxide thin film on silicon substrate by pulsed laser deposition
Creators
- 1. Department of Physics and Materials Science, City University of Hong Kong, Kowloon, Hong Kong (China)
- 2. Department of Physic, Baptist University, Kowloon Tong, Hong Kong (China)
- 3. Department of Physics, Suzhou University, Suzhou 215006 (China)
- 4. National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University, Nanjing 210093 (China)
Description
Germanium oxide thin films on silicon substrate were produced using pulsed laser deposition method under adjusted substrate temperature and oxygen pressure. There existed two PL bands observed in our samples, violet and blue bands. We attributed both of them to the neutral oxygen vacancy (NOV) but of different types: GeGe and GeSi, respectively. Fourier transform infrared spectra (FTIR) measurements in our samples not only proved the GeOSi vibration but also assigned the peaks around 1000-bar cm-1 in Si-Ge oxide system qualitatively
Additional details
Identifiers
- DOI
- 10.1016/j.physleta.2004.07.029;
- PII
- S0375-9601(04)01016-3;
Publishing Information
- Journal Title
- Physics Letters. A
- Journal Volume
- 331
- Journal Issue
- 3-4
- Journal Page Range
- p. 248-251
- ISSN
- 0375-9601
- CODEN
- PYLAAG
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36059647
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COLOR CENTERS; CRYSTAL GROWTH; ENERGY BEAM DEPOSITION; FOURIER TRANSFORMATION; GERMANIUM OXIDES; INFRARED SPECTRA; LASER RADIATION; OPTICAL PROPERTIES; OXYGEN; PHOTOLUMINESCENCE; PULSED IRRADIATION; SILICON; SUBSTRATES; THIN FILMS
- Descriptors DEC
- CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DEPOSITION; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; FILMS; GERMANIUM COMPOUNDS; INTEGRAL TRANSFORMATIONS; IRRADIATION; LUMINESCENCE; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; PHYSICAL PROPERTIES; POINT DEFECTS; RADIATIONS; SEMIMETALS; SPECTRA; SURFACE COATING; TRANSFORMATIONS; VACANCIES
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.