Published May 15, 2000 | Version v1
Journal article

Dynamical coherent illumination for X-ray microscopy at 3rd generation synchrotron radiation sources: First results with X-rays at the Ca-K edge (4 keV)

  • 1. FOM-Institute for Plasmaphysics Rijnhuizen, P.O. -Box 1207, NL-3430 BE Nieuwegein (Netherlands)
  • 2. European Synchrotron Radiation Facility (ESRF), BP 220, F-38043 Grenoble (France)
  • 3. Forschungseinrichtung Roentgenphysik, Geiststr. 11, D-37073 Goettingen (Germany)

Description

Dynamical coherent illumination is a way to deal with the illumination problems which emerge from the use of low emittance sources at recent synchrotron radiation sources for a transmission X-ray microscope (TXM). An illumination system, which uses two rotating mirrors to provide dynamical coherent illumination has been realized and tested at the TXM at ESRF's ID 21 Beamline. First results are presented and compared to results obtained with partial coherent illumination

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
507
Journal Issue
1
Journal Page Range
p. 464-467
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
6. international conference on X-ray microscopy
Dates
2-6 Aug 1999
Place
Berkeley, CA (United States)

Optional Information

Notes
(c) 2000 American Institute of Physics.