Published May 2023 | Version v1
Journal article

EMuS - a pulsed muon facility for multidisciplinary research

  • 1. Spallation Neutron Source Science Center, Dongguan (China)
  • 2. School of Nuclear Sciences and Technology, University of Chinese Academy of Sciences, Beijing (China)
  • 3. Institute of High Energy Physics, Chinese Academy of Sciences, Beijing (China)
  • 4. State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei (China)

Description

A pulsed muon facility (the so-called EMuS) at the China Spallation Neutron Source (CSNS) has been studied since 2007. It aims for multidisciplinary applications but with a focus on those based on muon spin rotation/relaxation/resonance techniques. As a standalone facility, EMuS will take about 5% or 25 kW of the total beam power (500 kW) from the CSNS-II accelerator complex. Two schemes have been designed: the baseline scheme is based on an inner conical target in graphite and superconducting solenoids for the capture and transport of pions and muons; the simplified scheme is based on a conventional thick target and room-temperature magnets for transport. With the former, multiple kinds of muon beams can be provided, from surface muons, decay muons, negative muons, to low-energy muons. Mainly surface muons are available with the simplified scheme. With a number of novel design concepts such as forward capture of pions/muons from a target station based on superconducting solenoids and triple spatial beam splitting of a muon beam, the design aspects of EMuS are presented here. The wide application potential and the R&D progress are also included. (© 2022 Wiley‐VCH GmbH)

Availability note (English)

Available from: http://dx.doi.org/10.1002/pssa.202200426

Additional details

Identifiers

Publishing Information

Journal Title
Physica Status Solidi. A, Applications and Materials Science (Online)
Journal Volume
220
Journal Issue
10
Journal Page Range
p. 1-10
ISSN
1862-6319
CODEN
PSSABA

Optional Information

Notes
AID: 2200426; Radiation and emission in materials