Surface enhanced Raman spectroscopy of fullerene C₆₀ drop-deposited on the silvered porous silicon

Surface enhanced Raman spectroscopy (SERS) of fullerene C₆₀ drop-deposited from the 1.4·10^-4 M aqueous solutions on the silvered porous silicon (Ag/PS) is reported for the first time. The used concentration is found to be not detected by the ordinary Raman spectroscopy. It is shown that SERS-spectrum of the fullerene deposited from the air-aged solution are characterized by less intensity than that of the fullerene solution kept out of the air. This indicates degradation of the fullerene solution due to oxidation. The results are prospective for the fast qualitative and quantitative analysis of the fullerene-based materials. (paper)