Published January 1, 1999 | Version v1
Report

Rutherford Backscattering and Channeling Studies of Al and Mg Diffusion in Iron Oxide Thin Films

  • 1. BATTELLE PACIFIC NEW LAB (United States)
  • 2. BATTELLE PACIFIC NEW LAB (US)
  • 3. ASSOC WESTERN UNIVERSITY (US)

Description

Thin films of alpha-Fe2O3(0001) (hermatite) and gamma-Fe2O3 (001) (maghemite) were epitaxially grown on Al2O3(0001) substrates, respectively, using the new molecular beam epitaxy (MBE) system at the Environmental Molecular Sciences Laboratory (EMSL). We have investigated the crystalline quality of these films using Rutherford Backscattering (RBS) and channeling experiments. Minimum yields obtained from aligned and random spectra are 2.7+-0.3% for the alpha-Fe2o3(0001) film and 14.5+-0.6% for the gamma-Fe2O3 (001) film. Al and Mg outdiffusion into the hematite and maghemite films were observed at higher temperatures. Indiffusion of Fe atoms from the film into the substrate was observed for the gamma-Fe2o3(001)/MgO(001) system. In contrast, no Fe indiffusion was observed for the sapphire substrate

Availability note (English)

Available from 475(508-511); American Institute of Physics,Woodbury, ,UNITED STATES.

Additional details

Publishing Information

Imprint Pagination
[vp.]
Report number
PNNL-SA--30456

Conference

Title
Applications of Accelerators in Research and Industry
Acronym
15. International Conference
Dates
Nov 1998
Place
Denton, TX (United States)

Optional Information

Contract/Grant/Project number
AC06-76RL01830
Funding organization
US Department of Energy (United States)