Limits on the accuracy of drift chambers and calibration beams
Description
A glance at the letters of intent for experiments at LEP which have been submitted to CERN on 31 January 1982 show that drift chambers of one type or another are still very popular and are considered as being the main candidate for detecting charged particles even eight years from now. The understanding of intrinsic limits on the spatial accuracy of drift chambers, and the development of new methods for calibrating them, are therefore still relevant. The present talk attempts to review the state of the art. Two classes are considered: i) Extremely accurate detectors for vertex reconstruction around the interaction region. ii) Very large detectors of the projection-chamber or imaging-chamber type, where the moderate accuracy of individual measurement (sigma/sub w/ approx. = 200 μm) is compensated by the relatively large number of points on each track. Two questions studied in this talk are: i) What are the fundamental limits on the accuracy and the two-particle resolution in a gaseous drift chamber. How can performances be improved, by the proper choice of gas and running conditions, or by better detection methods. ii) What, in practice, are the limits encountered in large detectors. Is it possible to limit effects of systematics by proper design of the detector. Can X-ray and UV calibration beams be used
Additional details
Publishing Information
- Imprint Title
- Proceedings of the international conference on instrumentation for colliding beam physics
- Journal Page Range
- p. 1-11.
- Report number
- SLAC--250
Conference
- Title
- International conference on instrumentation for colliding beam physics.
- Dates
- 17-23 Feb 1982.
- Place
- Stanford, CA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 16068762
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; CALIBRATION; CHARGED PARTICLE DETECTION; DRIFT CHAMBERS; LASERS; PARTICLE TRACKS; REVIEWS; SPATIAL RESOLUTION; STABILITY; X RADIATION
- Descriptors DEC
- AMPLIFIERS; DETECTION; DOCUMENT TYPES; ELECTROMAGNETIC RADIATION; EQUIPMENT; IONIZING RADIATIONS; MEASURING INSTRUMENTS; MULTIWIRE PROPORTIONAL CHAMBER; PROPORTIONAL COUNTERS; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; RESOLUTION