Published January 2007
| Version v1
Journal article
Luminescent properties of Zn2SiO4:Mn2+ phosphor under UV, VUV and CR excitation
Creators
- 1. Department of Materials Science, Lanzhou University, Lanzhou 730000 (China)
Description
Zn2-xSiO4:xMn2+ (06A1)) upon 254nm, 147nm and CR excitation, and the maximum emission intensity of Zn2-xSiO4:xMn2+ (0<x=<0.10) was obtained at the Mn2+ concentration of x=0.08, 0.04, 0.02, respectively. The relaxation of excitation energy under the three excitation energies was investigated; the result shows that Mn2+ was excited directly under UV excitation; upon CR excitation, the electron beam mainly excited the host lattice; for VUV excitation, Mn's direct excitation and excitation on the host both existed, and an effective energy transfer process could occur from host to Mn2+ via exchanging interaction in Zn2SiO4:Mn2+
Additional details
Identifiers
- DOI
- 10.1016/j.jlumin.2006.01.352;
- PII
- S0022-2313(06)00357-7;
Publishing Information
- Journal Title
- Journal of Luminescence
- Journal Volume
- 122-123
- Journal Page Range
- p. 1006-1008
- ISSN
- 0022-2313
- CODEN
- JLUMA8
Conference
- Title
- 2005 International conference on luminescence and optical spectroscopy of condensed matter
- Acronym
- ICL '05
- Dates
- 25-29 Jul 2005
- Place
- Beijing (China)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38037178
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CATHODOLUMINESCENCE; ELECTRON BEAMS; ENERGY TRANSFER; EXCHANGE INTERACTIONS; EXCITATION; FAR ULTRAVIOLET RADIATION; HOST; MANGANESE IONS; PHOSPHORS; PHOTOLUMINESCENCE; ZINC SILICATES
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; ELECTROMAGNETIC RADIATION; EMISSION; ENERGY-LEVEL TRANSITIONS; INTERACTIONS; IONS; LEPTON BEAMS; LUMINESCENCE; OXYGEN COMPOUNDS; PARTICLE BEAMS; PHOTON EMISSION; RADIATIONS; SILICATES; SILICON COMPOUNDS; ULTRAVIOLET RADIATION; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.