Published September 3, 2012
| Version v1
Journal article
Electronic structure of graphene oxide and reduced graphene oxide monolayers
- 1. Central Surface Analytical Facility, Indian Institute of Technology Bombay, Mumbai 400076 (India)
- 2. Department of Physics, Indian Institute of Technology Bombay, Mumbai 400076 (India)
Description
Graphene oxide (GO) monolayers obtained by Langmuir Blodgett route and suitably treated to obtain reduced graphene oxide (RGO) monolayers were studied by photoelectron spectroscopy. Upon reduction of GO to form RGO C1s x-ray photoelectron spectra showed increase in graphitic carbon content, while ultraviolet photoelectron spectra showed increase in intensity corresponding to C2p-π electrons (∼3.5 eV). X-ray excited Auger transitions C(KVV) and plasmon energy loss of C1s photoelectrons have been analyzed to elucidate the valence band structure. The effective number of (π+σ) electrons as obtained from energy loss spectra was found to increase by ∼28% on reduction of GO.
Additional details
Identifiers
- DOI
- 10.1063/1.4749841;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 101
- Journal Issue
- 10
- Journal Page Range
- p. 103103-103103.5
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44039219
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- AUGER ELECTRON SPECTROSCOPY; ELECTRONIC STRUCTURE; ENERGY LOSSES; ENERGY-LOSS SPECTROSCOPY; FILMS; GRAPHENE; GRAPHITE; OXIDES; REDUCTION; ULTRAVIOLET RADIATION; X RADIATION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CARBON; CHALCOGENIDES; CHEMICAL REACTIONS; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTS; IONIZING RADIATIONS; LOSSES; MINERALS; NONMETALS; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; RADIATIONS; SPECTROSCOPY
Optional Information
- Notes
- (c) 2012 American Institute of Physics