Theoretical and Experimental Study of Optical Coherence Tomography (OCT) Signals Using an Analytical Transport Model
Creators
- 1. Department of Optics, Instituto Nacional de Astrofisica Optica y Electronica (INAOE), 72840 Tonantzintla, Puebla (Mexico)
Description
Optical coherence tomography (OCT) is a non-invasive low coherent interferometric technique that provides cross-sectional images of turbid media. OCT is based on the classical Michelson interferometer where the mirror of the reference arm is oscillating and the signal arm contains a biological sample. In this work, we analyzed theoretically the heterodyne optical signal adopting the so called extended Huygens-Fresnel principle (EHFP). We use simulated OCT images with known optical properties to test an algorithm developed by ourselves to recover the scattering coefficient and we recovered the scattering coefficient with a relative error less than 5% for noisy signals. In addition, we applied this algorithm to OCT images from phantoms of known optical properties; in this case curves were indistinguishable. A revision of the validity of the analytical model applied to our system should be done.
Additional details
Identifiers
- DOI
- 10.1063/1.3531595;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1310
- Journal Issue
- 1
- Journal Page Range
- p. 154-157
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 11. Mexican symposium on medical physics
- Dates
- 19-22 Mar 2010
- Place
- Mexico City (Mexico)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42099855
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S62: RADIOLOGY AND NUCLEAR MEDICINE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALGORITHMS; COHERENT RADIATION; IMAGES; MICHELSON INTERFEROMETER; OPTICAL PROPERTIES; PHANTOMS; SCATTERING; SIMULATION; TOMOGRAPHY; TRANSPORT THEORY
- Descriptors DEC
- DIAGNOSTIC TECHNIQUES; ELECTROMAGNETIC RADIATION; INTERFEROMETERS; MATHEMATICAL LOGIC; MEASURING INSTRUMENTS; MOCKUP; PHYSICAL PROPERTIES; RADIATIONS; STRUCTURAL MODELS
Optional Information
- Notes
- (c) 2010 American Institute of Physics