Published December 7, 2010 | Version v1
Journal article

Theoretical and Experimental Study of Optical Coherence Tomography (OCT) Signals Using an Analytical Transport Model

  • 1. Department of Optics, Instituto Nacional de Astrofisica Optica y Electronica (INAOE), 72840 Tonantzintla, Puebla (Mexico)

Description

Optical coherence tomography (OCT) is a non-invasive low coherent interferometric technique that provides cross-sectional images of turbid media. OCT is based on the classical Michelson interferometer where the mirror of the reference arm is oscillating and the signal arm contains a biological sample. In this work, we analyzed theoretically the heterodyne optical signal adopting the so called extended Huygens-Fresnel principle (EHFP). We use simulated OCT images with known optical properties to test an algorithm developed by ourselves to recover the scattering coefficient and we recovered the scattering coefficient with a relative error less than 5% for noisy signals. In addition, we applied this algorithm to OCT images from phantoms of known optical properties; in this case curves were indistinguishable. A revision of the validity of the analytical model applied to our system should be done.

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1310
Journal Issue
1
Journal Page Range
p. 154-157
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
11. Mexican symposium on medical physics
Dates
19-22 Mar 2010
Place
Mexico City (Mexico)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42099855
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S62: RADIOLOGY AND NUCLEAR MEDICINE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALGORITHMS; COHERENT RADIATION; IMAGES; MICHELSON INTERFEROMETER; OPTICAL PROPERTIES; PHANTOMS; SCATTERING; SIMULATION; TOMOGRAPHY; TRANSPORT THEORY
Descriptors DEC
DIAGNOSTIC TECHNIQUES; ELECTROMAGNETIC RADIATION; INTERFEROMETERS; MATHEMATICAL LOGIC; MEASURING INSTRUMENTS; MOCKUP; PHYSICAL PROPERTIES; RADIATIONS; STRUCTURAL MODELS

Optional Information

Notes
(c) 2010 American Institute of Physics