FATALIC: A fully integrated electronics readout for the ATLAS tile calorimeter at the HL-LHC
- 1. LPC Clermont-Ferrand, CNRS/IN2P3, Université Clermont Auvergne (France)
Description
The ATLAS Collaboration has started a vast program of upgrades in the context of high-luminosity LHC (HL-LHC) foreseen in 2024. The current readout electronics of every sub-detector, including the Tile Calorimeter, must be upgraded to comply with the extreme HL-LHC operating conditions. The ASIC described in this document, named Front-end ATlAs tiLe Integrated Circuit (FATALIC), has been developed to fulfill these requirements. FATALIC is based on a 130 nm CMOS technology and performs the complete signal processing (amplification, shaping and digitization) over a large dynamic range. A dedicated channel for low current is also designed to perform the detector calibration with a radioactive cesium source. The design and performances of FATALIC are described including test beam data analysis.
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2018.11.079;
- PII
- S0168900218317054;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 936
- Journal Page Range
- p. 316-318
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 14. Pisa Meeting on Advanced Detectors
- Acronym
- PM2018
- Dates
- 27 May - 2 Jun 2018
- Place
- La Biodola-Isola d'Elba, Livorno (Italy)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55016173
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMPLIFICATION; BEAMS; CALIBRATION; CALORIMETERS; CERN LHC; CESIUM; DATA ANALYSIS; DESIGN; INTEGRATED CIRCUITS; LUMINOSITY; PERFORMANCE; READOUT SYSTEMS; SIGNALS
- Descriptors DEC
- ACCELERATORS; ALKALI METALS; CYCLIC ACCELERATORS; DATA PROCESSING; ELECTRONIC CIRCUITS; ELEMENTS; MEASURING INSTRUMENTS; METALS; MICROELECTRONIC CIRCUITS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; PROCESSING; STORAGE RINGS; SYNCHROTRONS
Optional Information
- Copyright
- Copyright (c) 2018 Published by Elsevier B.V.