Published March 1987 | Version v1
Report Restricted

Semiempirical studies of atomic structure: Progress report, April 2, 1986-February 15, 1987

Description

Studies of the structure and properties of highly ionized many electron atoms are proceeding through a combination of experimental measurements, semiempirical modeling and systematizations, and ab initio theoretical calculations. Atomic systems which have both many electrons stripped away and many electrons remaining often occur as contaminants or controlled impurities in high temperature plasmas, but information on their spectroscopic properties remains fragmentary. Spectroscopic classifications require accuracies exceeding parts per million, which cannot be achieved by standard ab initio methods for these complex systems. Semiempirical systematizations of high precision data can provide these accuracies, and an increasing base of this data is becoming available through studies utilizing fast ion beam excitation, laser and tokamak produced plasmas, astrophysical sources, and conventional spectroscopic sources. This program seeks to acquire, systematize, and parametrize large blocks of data along, e.g., isoelectronic, homologous, isoionic, isonuclear, Rydberg, and yrast series for the exposition of predictive empirical regularities. Trends revealed are then tested through well chosen experimental measurements, and ab initio methods are used to seek quantitative understanding of the empirical regularities

Availability note (English)

MF available from INIS under the Report Number; Available from NTIS, PC A02/MF A01; 1 as DE87007320.

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Additional details

Publishing Information

Imprint Pagination
5 p.
Report number
DOE/ER/10676--9

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
18083702
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S99: GENERAL AND MISCELLANEOUS;
Resource subtype / Literary indicator
Progress Report
Descriptors DEI
DATA PROCESSING; ENERGY LEVELS; FINE STRUCTURE; ISOELECTRONIC ATOMS; MULTICHARGED IONS; PARALLEL PROCESSING; PLASMA DIAGNOSTICS; SPECTRA
Descriptors DEC
ATOMS; CHARGED PARTICLES; IONS; PROGRAMMING

Optional Information

Notes
Portions of this document are illegible in microfiche products.