Semiempirical studies of atomic structure: Progress report, April 2, 1986-February 15, 1987
Description
Studies of the structure and properties of highly ionized many electron atoms are proceeding through a combination of experimental measurements, semiempirical modeling and systematizations, and ab initio theoretical calculations. Atomic systems which have both many electrons stripped away and many electrons remaining often occur as contaminants or controlled impurities in high temperature plasmas, but information on their spectroscopic properties remains fragmentary. Spectroscopic classifications require accuracies exceeding parts per million, which cannot be achieved by standard ab initio methods for these complex systems. Semiempirical systematizations of high precision data can provide these accuracies, and an increasing base of this data is becoming available through studies utilizing fast ion beam excitation, laser and tokamak produced plasmas, astrophysical sources, and conventional spectroscopic sources. This program seeks to acquire, systematize, and parametrize large blocks of data along, e.g., isoelectronic, homologous, isoionic, isonuclear, Rydberg, and yrast series for the exposition of predictive empirical regularities. Trends revealed are then tested through well chosen experimental measurements, and ab initio methods are used to seek quantitative understanding of the empirical regularities
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS, PC A02/MF A01; 1 as DE87007320.
Files
Additional details
Publishing Information
- Imprint Pagination
- 5 p.
- Report number
- DOE/ER/10676--9
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 18083702
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S99: GENERAL AND MISCELLANEOUS;
- Resource subtype / Literary indicator
- Progress Report
- Descriptors DEI
- DATA PROCESSING; ENERGY LEVELS; FINE STRUCTURE; ISOELECTRONIC ATOMS; MULTICHARGED IONS; PARALLEL PROCESSING; PLASMA DIAGNOSTICS; SPECTRA
- Descriptors DEC
- ATOMS; CHARGED PARTICLES; IONS; PROGRAMMING
Optional Information
- Notes
- Portions of this document are illegible in microfiche products.