Generalized pin factor methodology for LWR reload cores with discrete burnable absorbers

Discrete burnable absorbers are used to suppress excess reactivity as well as peak pin power in an assembly. After the burn-out of absorption material, discrete burnable absorbers are usually removed from assembly guide tubes for the next cycle. For that case, the pin factors with discrete burnable absorbers cannot be used since the assembly configuration is physically changed. The pin factors without discrete burnable absorbers also have noticeable deviation from the actual case because they do not take into account the history effect due to the residence of discrete burnable absorbers for the previous cycle. In this paper, the generalized pin factor (GPF) method is developed to accurately predict pin powers by considering the history effect. The method uses a second-order polynomial function to approximate the history effect which builds up during the residence of burnable absorber material and employs a linear approximation to simulate the decay of the history effect after discrete burnable absorbers are removed. The verification results from Westinghouse Vantage- 5H assemblies with WABAs showed that pin power errors were significantly reduced by using the GPF. (authors)