Precise small-angle X-ray scattering evaluation of the pore structures in track-etched membranes: Comparison with other convenient evaluation methods
Creators
- 1. Neutron Science and Technology Center, Comprehensive Research Organization for Science and Society, 162-1, Shirakata, Tokai-mura, Naka-gun, Ibaraki 319-1106 (Japan)
- 2. Department of Polymer Chemistry, Gradual School of Engineering, Kyoto University, Kyotodaigaku-katsura, Kyoto 615-8510 (Japan)
Description
Poly(ethylene terephthalate) (PET)-based track-etched membranes (TMs) with pore sizes ranging from few nanometers to approximately 1 μm are used in various applications in the biological field, and their pore structures are determined by small-angle X-ray scattering (SAXS). These TMs with the nanometer-sized cylindrical pores aligned parallel to the film thickness direction are produced by chemical etching of the track in the PET films irradiated by heavy ions with the sodium hydroxide aqueous solution. It is well known that SAXS allows us to precisely and statistically estimate the pore size and the pore size distribution in the TMs by using the form factor of a cylinder with the extremely long pore length relative to the pore diameter. The results obtained were compared with those estimated with scanning electron microscopy and gas permeability measurements. The result showed that the gas permeability measurement is convenient to evaluate the pore size of TMs within a wide length scale, and the SEM observation is also suited to estimate the pore size, although SEM observation is usually limited above approximately 30 nm.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2017.01.002Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2017.01.002;
- PII
- S0168-583X(17)30002-2;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 394
- Journal Page Range
- p. 121-125
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48071479
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- APPROXIMATIONS; AQUEOUS SOLUTIONS; COMPARATIVE EVALUATIONS; ETCHING; ETHYLENE; FILMS; FORM FACTORS; HEAVY IONS; IRRADIATION; LENGTH; PARTICLE TRACKS; PERMEABILITY; PORE STRUCTURE; POSITRON COMPUTED TOMOGRAPHY; SCANNING ELECTRON MICROSCOPY; SMALL ANGLE SCATTERING; SODIUM HYDROXIDES; THICKNESS; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALI METAL COMPOUNDS; ALKENES; CALCULATION METHODS; CHARGED PARTICLES; COHERENT SCATTERING; COMPUTERIZED TOMOGRAPHY; DIAGNOSTIC TECHNIQUES; DIFFRACTION; DIMENSIONLESS NUMBERS; DIMENSIONS; DISPERSIONS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; EMISSION COMPUTED TOMOGRAPHY; EVALUATION; HOMOGENEOUS MIXTURES; HYDROCARBONS; HYDROGEN COMPOUNDS; HYDROXIDES; IONIZING RADIATIONS; IONS; MICROSCOPY; MICROSTRUCTURE; MIXTURES; ORGANIC COMPOUNDS; OXYGEN COMPOUNDS; PARTICLE PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SODIUM COMPOUNDS; SOLUTIONS; SURFACE FINISHING; TOMOGRAPHY
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.