Inversion-voltammetric determination of n·10-4-n·10-5% Cu, Pb, Cd, Fe, Bi, Te, Au in microspecimens of ZnGeP2 crystals

The technique of inversion volt ammetric analysis of ZnGeP2 microsamples for n x 10 -4-n x 105% content of Cu, Pb, Cd, Fe, Bi, Au, Te additions is developed. ZnGeP2 crystal is dissolved in HCl : HNO3(3:1) mixture, germanium is separated in the form of GeCl4 and the interfering Zn effect is eliminated at 0.9V electrolysis potential. Oxygen removal from the solution is performed by the bubbling of gaseous nitrogen. The technique can be extractionless as well as with Fe and Au extraction separation. The results of estimating the content of impurities by two techniques differ slightly