Published August 1, 2013 | Version v1
Journal article

Twinning during recrystallization cooling in α-Zr alloy

  • 1. Department of Nuclear Engineering, North Carolina State University, Raleigh, NC 27695-7909 (United States)
  • 2. College of Materials Science and Engineering, Chongqing University, Chongqing 400044 (China)

Description

Recently, twinning induced by intergranular thermal residual stresses (ITRSs) has been first reported in a Zr alloy after β→α furnace cooling. To further explore this kind of twinning behavior, microstructures and textures of the Zr alloy during α annealing between 650 and 750 °C after β quenching were investigated in the present work, by use of X-ray diffraction, electron backscatter diffraction and electron channeling contrast imaging techniques. Results indicate that the ITRS-induced twins could also occur during cooling after α-recrystallization annealing in the Zr alloy, closely related to both the grain size and the texture. When the recrystallization texture is relatively random, high tensile ITRSs up to ∼200 MPa along c-axis could be accumulated. Tensile twins can only be induced by the tensile ITRS in the nearly texture-free Zr specimen with an average grain size larger than ∼20 μm

Availability note (English)

Available from http://dx.doi.org/10.1016/j.msea.2013.04.010

Additional details

Identifiers

DOI
10.1016/j.msea.2013.04.010;
PII
S0921-5093(13)00392-4;

Publishing Information

Journal Title
Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
Journal Volume
576
Journal Page Range
p. 320-325
ISSN
0921-5093
CODEN
MSAPE3

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45106237
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALLOYS; ELECTRON CHANNELING; GRAIN SIZE; PRESSURE RANGE MEGA PA 100-1000; QUENCHING; RECRYSTALLIZATION; RESIDUAL STRESSES; TEXTURE; TWINNING; X-RAY DIFFRACTION
Descriptors DEC
CHANNELING; COHERENT SCATTERING; DIFFRACTION; MICROSTRUCTURE; PRESSURE RANGE; PRESSURE RANGE MEGA PA; SCATTERING; SIZE; STRESSES

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.