Twinning during recrystallization cooling in α-Zr alloy
- 1. Department of Nuclear Engineering, North Carolina State University, Raleigh, NC 27695-7909 (United States)
- 2. College of Materials Science and Engineering, Chongqing University, Chongqing 400044 (China)
Description
Recently, twinning induced by intergranular thermal residual stresses (ITRSs) has been first reported in a Zr alloy after β→α furnace cooling. To further explore this kind of twinning behavior, microstructures and textures of the Zr alloy during α annealing between 650 and 750 °C after β quenching were investigated in the present work, by use of X-ray diffraction, electron backscatter diffraction and electron channeling contrast imaging techniques. Results indicate that the ITRS-induced twins could also occur during cooling after α-recrystallization annealing in the Zr alloy, closely related to both the grain size and the texture. When the recrystallization texture is relatively random, high tensile ITRSs up to ∼200 MPa along c-axis could be accumulated. Tensile twins can only be induced by the tensile ITRS in the nearly texture-free Zr specimen with an average grain size larger than ∼20 μm
Availability note (English)
Available from http://dx.doi.org/10.1016/j.msea.2013.04.010Additional details
Identifiers
- DOI
- 10.1016/j.msea.2013.04.010;
- PII
- S0921-5093(13)00392-4;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 576
- Journal Page Range
- p. 320-325
- ISSN
- 0921-5093
- CODEN
- MSAPE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45106237
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALLOYS; ELECTRON CHANNELING; GRAIN SIZE; PRESSURE RANGE MEGA PA 100-1000; QUENCHING; RECRYSTALLIZATION; RESIDUAL STRESSES; TEXTURE; TWINNING; X-RAY DIFFRACTION
- Descriptors DEC
- CHANNELING; COHERENT SCATTERING; DIFFRACTION; MICROSTRUCTURE; PRESSURE RANGE; PRESSURE RANGE MEGA PA; SCATTERING; SIZE; STRESSES
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.