Sputter-induced compositional modifications in a Ni-Au alloy
Creators
- 1. Argonne National Lab., IL (USA). Materials Science and Technology Div.
Description
Surface and subsurface composition changes induced by heating and by ion sputtering of a Ni-6 at% Au alloy at temperatures between 25 and 6000C were measured in situ, using the ion-scattering-spectroscopy technique. Upon heating, Au atoms segregated to the alloy surface; the enthalpy and entropy of Gibbsian adsorption were found to be -0.45 eV and -1.09k. During sputtering, the steady-state surface composition was noticeable temperature-dependent above proportional4000C, which could be interpreted in terms of significant contributions of the second atom layer to the sputtered-atom flux. Steady-state concentration profiles measured after rapid cooling of the target to room temperature were analyzed to gain information about the temperature dependence of the effective altered-layer thickness, from which radiation-enhanced diffusion coefficients in the bombarded alloy were determined. (orig.)
Additional details
Publishing Information
- Journal Title
- J. Nucl. Mater.
- Journal Volume
- 133/134
- Series
- J. Nucl. Mater.
- Journal Page Range
- 427-429
- ISSN
- 0022-3115
- CODEN
- JNUMA
Conference
- Title
- 1. international conference on fusion reactor materials (ICFRM-1).
- Dates
- 3-6 Dec 1984.
- Place
- Tokyo (Japan).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 17016003
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- ADSORPTION; CHEMICAL COMPOSITION; DIFFUSION; EXPERIMENTAL DATA; GOLD ALLOYS; HIGH TEMPERATURE; ION SCATTERING ANALYSIS; MEDIUM TEMPERATURE; NEON IONS; NICKEL ALLOYS; POINT DEFECTS; RADIATION EFFECTS; SPUTTERING; TEMPERATURE DEPENDENCE; THICKNESS; TIME DEPENDENCE
- Descriptors DEC
- ALLOYS; CHARGED PARTICLES; CHEMICAL ANALYSIS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DATA; DIMENSIONS; INFORMATION; IONS; NONDESTRUCTIVE ANALYSIS; NUMERICAL DATA
Optional Information
- Notes
- Also published as CONF-841246--2.