High-energy X-ray diffraction and reverse Monte Carlo simulation of xBiO3-(100-X)TeO2 glass and anti-glass phases
- 1. Department of Physics, Guru Nanak Dev University, Amritsar-143005 (India)
- 2. Deutsches Elektronen Synchrotron OESY, Notkestrasse 85, 22607 Hamburg (Germany)
Description
The structure of glass and anti-glass samples from the system: xBiO3-(100-X)TeO2 (x = 3,5,7 and 20-mol %) were studied using X-ray diffraction experiments at High Energy Materials Science Beamline of the PETRA synchrotron. The diffraction data was analysed by Reverse Monte Carlo (RMC) simulations and short range structural properties such as the near-neighbour distances the Te-O co-ordination (NTe-o), distribution of bond lengths and bond angles in glass, and anti-glass phases of the Bi2O1-TeO2 system were determined. The structural refinement confirms the presence of BiO5, TeO3 and TeO4 units in Bi2Te4O11 with the average NTe-O and NBio values of 3.31 and 4.22, respectively. The bond lengths of Te-Obridging and Te-Onon-bridging were calculated to be 1.94 Å and 2.03 Å, respectively
Additional details
Publishing Information
- Publisher
- Bhabha Atomic Research Centre
- Imprint Place
- Mumbai (India)
- Imprint Title
- Proceedings of the forty seventh national seminar on crystallography
- Imprint Pagination
- 298 p.
- Journal Page Range
- p. 174-175
Conference
- Title
- 47. national seminar on crystallography
- Acronym
- NSC47
- Dates
- 19-22 Jun 2019
- Place
- Mumbai (India)
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 53058909
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BINDING ENERGY; BISMUTH OXIDES; BOND LENGTHS; CRYSTALLOGRAPHY; STRUCTURAL CHEMICAL ANALYSIS; TELLURIUM OXIDES; X-RAY DIFFRACTION
- Descriptors DEC
- BISMUTH COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; ENERGY; LENGTH; OXIDES; OXYGEN COMPOUNDS; SCATTERING; TELLURIUM COMPOUNDS