Published 2019 | Version v1
Book

High-energy X-ray diffraction and reverse Monte Carlo simulation of xBiO3-(100-X)TeO2 glass and anti-glass phases

  • 1. Department of Physics, Guru Nanak Dev University, Amritsar-143005 (India)
  • 2. Deutsches Elektronen Synchrotron OESY, Notkestrasse 85, 22607 Hamburg (Germany)

Description

The structure of glass and anti-glass samples from the system: xBiO3-(100-X)TeO2 (x = 3,5,7 and 20-mol %) were studied using X-ray diffraction experiments at High Energy Materials Science Beamline of the PETRA synchrotron. The diffraction data was analysed by Reverse Monte Carlo (RMC) simulations and short range structural properties such as the near-neighbour distances the Te-O co-ordination (NTe-o), distribution of bond lengths and bond angles in glass, and anti-glass phases of the Bi2O1-TeO2 system were determined. The structural refinement confirms the presence of BiO5, TeO3 and TeO4 units in Bi2Te4O11 with the average NTe-O and NBio values of 3.31 and 4.22, respectively. The bond lengths of Te-Obridging and Te-Onon-bridging were calculated to be 1.94 Å and 2.03 Å, respectively

Part of:
Proceedings of the forty seventh national seminar on crystallography

Additional details

Publishing Information

Publisher
Bhabha Atomic Research Centre
Imprint Place
Mumbai (India)
Imprint Title
Proceedings of the forty seventh national seminar on crystallography
Imprint Pagination
298 p.
Journal Page Range
p. 174-175

Conference

Title
47. national seminar on crystallography
Acronym
NSC47
Dates
19-22 Jun 2019
Place
Mumbai (India)

INIS

Country of Publication
India
Country of Input or Organization
India
INIS RN
53058909
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BINDING ENERGY; BISMUTH OXIDES; BOND LENGTHS; CRYSTALLOGRAPHY; STRUCTURAL CHEMICAL ANALYSIS; TELLURIUM OXIDES; X-RAY DIFFRACTION
Descriptors DEC
BISMUTH COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; ENERGY; LENGTH; OXIDES; OXYGEN COMPOUNDS; SCATTERING; TELLURIUM COMPOUNDS

Optional Information