Determination of trace elements in silicates by X-ray fluorescence spectrometry

A source of serious difficulties in X-ray-spectroscopic analysis is a great physical and chemical composition variability of geological bed samples being concerned with the matrix effects. A simple and effective correction of these effects is based on the comparison of intensity of analytical lines to the intensity of background or Compton peak. In the described method the correction of matrix effects has been carried out by measuring the background in a way minimalizing the number of spectrometric measurements what shortens the time of analysis. Additional correction was applied in the case of analytical coincidence. (author)