Secondary negative ion emission from cadmium and its compounds

The secondary emission of negative ions of different composition and electron affinity sputtered by O2+ ions from Cd, CdTe and CdxHg1-xTe has been studied. Relative ion yields and energy distributions have been measured. It is shown that the presence of potassium affects substantially the yields of atomic negative ions and negative ions of unsaturated oxide. By contrast the yields of negative ions of more saturated oxides with sufficiently large energy of electron affinity are intensive to the presence of K and a work function change induced by it which conforms to the local bond breaking model. The advantages of using such ions in SIMS analusis are discussed