Published May 2001
| Version v1
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Two channel microwave reflectometry and interferometry using PIN switches
Creators
- 1. Tokyo Univ., School of Science, Tokyo (Japan)
- 2. Tokyo Univ., School of Frontier Sciences, Tokyo (Japan)
Description
no abstract available
Files
33014555.pdf
Files
(233.8 kB)
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Additional details
Publishing Information
- Imprint Title
- Proceeding of the 5th international workshop on reflectometry
- Imprint Pagination
- 100 p.
- Journal Page Range
- p. 64-67
- Report number
- NIFS-PROC--49
Conference
- Title
- 5. international workshop on reflectometry
- Dates
- 5-7 Mar 2001
- Place
- Toki, Gifu (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 33014555
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- GHZ RANGE 01-100; INTERFEROMETRY; MACH-ZEHNDER INTERFEROMETER; MICROWAVE EQUIPMENT; MICROWAVE RADIATION; OPTICAL REFLECTION; PLASMA DENSITY; PLASMA DIAGNOSTICS; REFLECTIVITY; SPECTRAL REFLECTANCE; SWITCHES; TOKAMAK DEVICES
- Descriptors DEC
- CLOSED PLASMA DEVICES; ELECTRICAL EQUIPMENT; ELECTROMAGNETIC RADIATION; ELECTRONIC EQUIPMENT; EQUIPMENT; FREQUENCY RANGE; GHZ RANGE; INTERFEROMETERS; MEASURING INSTRUMENTS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; REFLECTION; SURFACE PROPERTIES; THERMONUCLEAR DEVICES
Optional Information
- Notes
- 2 refs., 4 figs.