Published February 2019
| Version v1
Journal article
The Morphology and Electronic Properties of Si Nanoscale Structures on a CaF2 Surface
- 1. Tashkent State Technical University (Uzbekistan)
Description
The surface morphology, crystal structures, and band-energy parameters have been studied for nanofilms and regularly arranged nanoscale Si phases with a thickness of 1–2 nm. The bandgap thickness of nanocrystalline Si phases with 2–3 single layers is found to be ~1.4 eV.
Additional details
Identifiers
Publishing Information
- Journal Title
- Technical Physics
- Journal Volume
- 64
- Journal Issue
- 2
- Journal Page Range
- p. 232-235
- ISSN
- 1063-7842
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51091746
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- CALCIUM FLUORIDES; CRYSTAL STRUCTURE; EV RANGE; MORPHOLOGY; NANOFILMS; NANOSTRUCTURES; SILICON; SURFACES; THICKNESS
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; CALCIUM COMPOUNDS; CALCIUM HALIDES; DIMENSIONS; ELEMENTS; ENERGY RANGE; FILMS; FLUORIDES; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; MATERIALS; NANOMATERIALS; SEMIMETALS; THIN FILMS
Optional Information
- Copyright
- Copyright (c) 2019 Pleiades Publishing, Ltd.