Published November 18, 2002 | Version v1
Journal article Metadata-only

Simple in-line EUV pulse characterization

Creators

  • 1. JILA, University of Colorado, Campus Box 440, Boulder, CO 80309 (United States)
  • 2. Dept. of Physics, SUNY Stony Brook, NY 11794-3800 (United States)

Description

We have developed a simple design for an in-line apparatus to measure the spectral and temporal characteristics of an EUV pulse. The apparatus can be used in front of an experiment without disrupting the beam

Additional details

Identifiers

DOI
10.1063/1.1521081;

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
641
Journal Issue
1
Journal Page Range
p. 587-590
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
8. international conference on X-ray lasers
Dates
27-31 May 2002
Place
Aspen, CO (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35090964
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
PULSES; TIME RESOLUTION; TIME-OF-FLIGHT METHOD; ULTRAVIOLET SPECTRA; X-RAY LASERS
Descriptors DEC
LASERS; RESOLUTION; SPECTRA; TIMING PROPERTIES

Optional Information

Notes
(c) 2002 American Institute of Physics