Published October 2004
| Version v1
Journal article
Electronic band structure in porous silicon studied by photoluminescence and photoluminescence excitation spectroscopy
Description
In this research, we used photoluminescence (PL) and photoluminescence excitation (PLE) to visualize the electronic band structure in porous silicon (PS). From the combined results of the PLE measurements at various PL emission energies and the PL measurements under excitation at various PLE absorption energies, we infer that three different electronic band structures, originating from different luminescent origins, give rise to the PL spectrum. Through either thermal activation or diffusive transfer, excited carriers are moved to each of the electronic band structures.
Additional details
Publishing Information
- Journal Title
- Journal of the Korean Physical Society
- Journal Volume
- 45
- Journal Issue
- 4
- Series
- 20 refs, 5 figs
- Journal Page Range
- p. 1127-1130
- ISSN
- 0374-4884
INIS
- Country of Publication
- Korea, Republic of
- Country of Input or Organization
- Korea, Republic of
- INIS RN
- 42013079
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ELECTRONIC STRUCTURE; ENERGY-LEVEL TRANSITIONS; EXCITATION; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; POROUS MATERIALS; SILICON; SPECTRA; SPECTROSCOPY; TESTING
- Descriptors DEC
- ELEMENTS; EMISSION; ENERGY-LEVEL TRANSITIONS; LUMINESCENCE; MATERIALS; PHOTON EMISSION; PHYSICAL PROPERTIES; SEMIMETALS