Published October 2004 | Version v1
Journal article

Electronic band structure in porous silicon studied by photoluminescence and photoluminescence excitation spectroscopy

  • 1. Kongju National University, Chungnam (Korea, Republic of)

Description

In this research, we used photoluminescence (PL) and photoluminescence excitation (PLE) to visualize the electronic band structure in porous silicon (PS). From the combined results of the PLE measurements at various PL emission energies and the PL measurements under excitation at various PLE absorption energies, we infer that three different electronic band structures, originating from different luminescent origins, give rise to the PL spectrum. Through either thermal activation or diffusive transfer, excited carriers are moved to each of the electronic band structures.

Additional details

Publishing Information

Journal Title
Journal of the Korean Physical Society
Journal Volume
45
Journal Issue
4
Series
20 refs, 5 figs
Journal Page Range
p. 1127-1130
ISSN
0374-4884