Published March 2003 | Version v1
Journal article Metadata-only

Pseudo color DEM in industrial CT section image inspection

Creators

  • 1. Tsinghua Univ., Beijing (China). Dept. of Engineering Physics

Description

In this paper, Digital Elevation Model (DEM) and pseudo color technology combined to form an algorithm for ICT section image display. This method has been implemented in our large industrial CT image reconstruction and inspection system and received good result. What's more, we can make full use of the information in CT section image to enhance visual effects and capability of defects detection

Additional details

Publishing Information

Journal Title
Nuclear Electronics and Detection Technology
Journal Volume
23
Journal Issue
2
Journal Page Range
p. 147-150
ISSN
0258-0934

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
35026579
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ALGORITHMS; COMPUTERIZED TOMOGRAPHY; DEFECTS; IMAGE PROCESSING; INDUSTRIAL RADIOGRAPHY; INSPECTION; MATHEMATICAL MODELS; TWO-DIMENSIONAL CALCULATIONS
Descriptors DEC
DIAGNOSTIC TECHNIQUES; MATERIALS TESTING; MATHEMATICAL LOGIC; NONDESTRUCTIVE TESTING; PROCESSING; TESTING; TOMOGRAPHY