Two dimensional photonic band gap pattering in thin chalcogenide glassy films
- 1. Electro-Optics Division, Soreq NRC, Yavne 81800 (Israel)
- 2. Physics Department, Ben-Gurion University, Beer-Sheva 84105 (Israel)
Description
Photonic band gap (PBG) based elements can significantly contribute to future integrated optical circuits. However, at the wavelength of 1500 nm, they require about 100 nm feature size lithographic processes, which, until now, have been typically accomplished with the help of e-beam lithography. Taking into account that all non-periodic features, e.g. waveguides and cavities, require only ∼300 nm resolution, the process can be separated in two stages. First, interference lithography is used for creation of periodic patterns with minute feature sizes. Second, the non-periodic lower resolution features are added by standard ultraviolet lithography. Using this method 1.3 μm thickness waveguides in 100 nm feature size hexagonal PBG environment were fabricated from high refractive index (n 2.2-2.5) chalcogenide photoresists
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2005.04.082;
- PII
- S0040-6090(05)00441-4;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 488
- Journal Issue
- 1-2
- Journal Page Range
- p. 185-188
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37019777
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHALCOGENIDES; ELECTRON BEAMS; GLASS; INTERFERENCE; LASERS; REFRACTIVE INDEX; THIN FILMS; ULTRAVIOLET RADIATION
- Descriptors DEC
- BEAMS; ELECTROMAGNETIC RADIATION; FILMS; LEPTON BEAMS; OPTICAL PROPERTIES; PARTICLE BEAMS; PHYSICAL PROPERTIES; RADIATIONS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.