Published February 2021
| Version v1
Journal article
A cobalt-nickel metal-alloy thin-film sensor for hydrogen-phosphate ion
- 1. Kyushu Institute of Technology, Department of Applied Chemistry, Kitakyushu, Fukuoka (Japan)
Description
Cobalt-nickel alloy thin-films were prepared by electrodepositing on Au-coated Al2O3 substrate from aqueous solutions of metal-salts, and applied as a potentiometric hydrogen-phosphate ion sensor. A doping of 20 mol% nickel in cobalt contributed to enhancing hydrogen-phosphate ion sensing performances, i.e., the sensing range and response time were drastically improved. The Co80Ni20 thin-film electrode showed good potentiometric response to hydrogen-phosphate ion between 1.0 x 10-5 and 1.0 x 10-3 M with a slope of -59 mV/decade and high anion selectivity. The 90% response time to 1 mM H2PO4- was as short as 15 s at pH 5.0, 30°C. A mixed potential sensing mechanism could be proposed on the basis of the results. (author)
Availability note (English)
Available from DOI: https://doi.org/10.2116/analsci.20P290Additional details
Identifiers
Publishing Information
- Journal Title
- Analytical Sciences (Online)
- Journal Volume
- 37
- Journal Issue
- 2
- Journal Page Range
- p. 337-340
- ISSN
- 1348-2246
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 52108362
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BINARY ALLOY SYSTEMS; COBALT BASE ALLOYS; COBALT SULFATES; ELECTRODEPOSITION; FOURIER TRANSFORM SPECTROMETERS; HYDROGEN IONS 1 MINUS; ION-SELECTIVE ELECTRODES; PHOSPHATES; POTENTIOMETRY; SCANNING ELECTRON MICROSCOPY; SPECTROPHOTOMETERS; THIN FILMS; ULTRAVIOLET SPECTROMETERS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ALLOY SYSTEMS; ALLOYS; ANIONS; CHARGED PARTICLES; CHEMICAL ANALYSIS; COBALT ALLOYS; COBALT COMPOUNDS; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTRODES; ELECTROLYSIS; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; FILMS; HYDROGEN IONS; IONS; LYSIS; MEASURING INSTRUMENTS; MICROSCOPY; OXYGEN COMPOUNDS; PHOSPHORUS COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; QUANTITATIVE CHEMICAL ANALYSIS; SCATTERING; SPECTROMETERS; SPECTROSCOPY; SULFATES; SULFUR COMPOUNDS; SURFACE COATING; TITRATION; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENT COMPOUNDS; VOLUMETRIC ANALYSIS
Optional Information
- Notes
- 20 refs., 8 figs.