Published September 2006 | Version v1
Journal article

Insulator Surface Charge Measurement Using an Improved Capacitive Probe

  • 1. State Key Lab for Electrical Insulation and Apparatus, Xi'an Jiaotong University, Xi'an 710049 (China)
  • 2. School of Electrical and Information Engineering, Hunan University, Changsha 410082 (China)
  • 3. Technische Universitaet Darmstadt, 64283 Darmstadt (Germany)
  • 4. Dept. of Electrical Engineering and Computer Science, University of Manitoba, Winnipeg (Canada)

Description

A surface charge measuring system using the capacitive probe method is analysed. The present study shows that the measuring system cannot have a steady-state output and that the error resulting from the finite leakage resistance of the measuring system will be accumulated during the measuring process. Based on the theoretical analysis a new type probe with a low charge leakage and high resolution is designed. The surface charge accumulated on the Teflon insulator under a DC voltage is measured using this new probe and some phenomena of the surface charging are reported

Availability note (English)

Available online at http://stacks.iop.org/1009-0630/8/565/pst6_5_15.pdf or at the Web site for the journal Plasma Science and Technology (ISSN 1009-0630) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Plasma Science and Technology
Journal Volume
8
Journal Issue
5
Journal Page Range
p. 565-568
ISSN
1009-0630