Published August 4, 2014 | Version v1
Journal article Metadata-only

Phase modulation mode of scanning ion conductance microscopy

Creators

  • 1. University of Chinese Academy of Sciences, Beijing 100049 (China)
  • 2. State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016 (China)
  • 3. Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, Pennsylvania 15261 (United States)

Description

This Letter reports a phase modulation (PM) mode of scanning ion conductance microscopy. In this mode, an AC current is directly generated by an AC voltage between the electrodes. The portion of the AC current in phase with the AC voltage, which is the current through the resistance path, is modulated by the tip-sample distance. It can be used as the input of feedback control to drive the scanner in Z direction. The PM mode, taking the advantages of both DC mode and traditional AC mode, is less prone to electronic noise and DC drift but maintains high scanning speed. The effectiveness of the PM mode has been proven by experiments

Additional details

Identifiers

DOI
10.1063/1.4891571;

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
105
Journal Issue
5
Journal Page Range
p. 053113-053113.4
ISSN
0003-6951
CODEN
APPLAB

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46020898
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
CLOSED-LOOP CONTROL; ELECTRIC CURRENTS; ELECTRODES; IONS; MODULATION; SCANNING TUNNELING MICROSCOPY
Descriptors DEC
CHARGED PARTICLES; CONTROL; CURRENTS; MICROSCOPY

Optional Information

Notes
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