Determination of manganese interdiffusion parameters in CoFe/IrMn bilayers by X-ray reflectometry

Full text: Interfacial diffusion is expected to have strong influence on the exchange bias coupling in ferromagnetic/antiferromagnetic bilayers, basic structures for spintronic devices [1]. In this work, X-ray reflectometry (XRR) in combination with the Fick's second law [2] was applied to determine manganese interdiffusion parameters in CoFe/IrMn exchange-biased bilayers prepared by magnetron sputtering. The layer thickness and the interfacial roughness of the samples were obtained by fitting the reflectivity curves and the values confirmed by transmission electron microscopy. The manganese diffusion coefficient at the interfaces is in the range of 10^-22 m²/s, and the activation energy for the interfacial diffusion of manganese is in the order of a few tens of kJ/mol, based on the values of interfacial roughness for different annealing temperatures. References: [1] L. E. Fernandez-Outon, M. S. Araujo Filho, R. E. Araujo, J. D. Ardisson, and W. A. A. Macedo. J. Appl. Phys. 113, 17D704 (2013). [2] J. Y. Wang, A. Zalar, Y.H. Zhao, E.J. Mittemeijer. Thin Solid Films. 433, 92 (2003). (author)