Contrast source inversion technique for the reconstruction of 3D inhomogeneous materials loaded in a rectangular waveguide
Creators
- 1. Lehrstuhl für Hochfrequenztechnik, Technische Universität München, Munich (Germany)
- 2. Department of Electronics and Telecommunications Engineering, Istanbul Technical University, Istanbul (Turkey)
Description
An inverse scattering approach based on the contrast source inversion (CSI) algorithm is presented for the determination of the three-dimensional (3D) complex permittivity variation of arbitrarily shaped materials loaded in a rectangular waveguide. First the problem is introduced by the definition of the electric field integral equation based data and object equations, which contain the dyadic Green function of an empty rectangular waveguide. The resulting inverse scattering problem for the unknown complex permittivity of the loading is solved by the CSI technique, which is adapted by a modal expansion approach for the guiding structures. A detailed numerical implementation of the method together with some illustrative examples is given to show the effectiveness as well as the capabilities of the method
Availability note (English)
Available from http://dx.doi.org/10.1088/0266-5611/27/10/105002Additional details
Identifiers
- DOI
- 10.1088/0266-5611/27/10/105002;
- PII
- S0266-5611(11)78308-3;
Publishing Information
- Journal Title
- Inverse Problems
- Journal Volume
- 27
- Journal Issue
- 10
- Journal Page Range
- [14 p.]
- ISSN
- 0266-5611
- CODEN
- INVPET
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45035783
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ALGORITHMS; ELECTRIC FIELDS; GREEN FUNCTION; INTEGRAL EQUATIONS; INVERSE SCATTERING PROBLEM; NUMERICAL ANALYSIS; PERMITTIVITY; THREE-DIMENSIONAL CALCULATIONS; VARIATIONS; WAVEGUIDES
- Descriptors DEC
- DIELECTRIC PROPERTIES; ELECTRICAL PROPERTIES; EQUATIONS; FUNCTIONS; MATHEMATICAL LOGIC; MATHEMATICS; PHYSICAL PROPERTIES