Large linear magnetoresistance caused by disorder in WTe2−δ thin film
Creators
- 1. Department of Physics, Beijing Normal University, Beijing 100875 (China)
Description
Weyl semimetal WTe2 has attracted considerable attention owing to its extremely large, unsaturated and quadratic magnetoresistance. Here, we study the magnetotransport properties of WTe2−δ thin film, which shows an unsaturated and linear magnetoresistance of up to ∼1650%. A more complex and accurate method, known as the maximum entropy mobility spectrum, is used to analyze the mobility and density of carriers. The results show that linear magnetoresistance can be explained by the classical disorder model because the slope of linear magnetoresistance and the crossover field are proportional to the mobility and inverse mobility, respectively. Furthermore, the validity of the maximum entropy mobility spectrum is validated by the Shubnikov–de Haas oscillations. Moreover, at low temperature, we determined that the unsaturated and near-quadratic magnetoresistance in the WTe1.93 thin film can be explained by charge compensation. Note that the electron–hole compensation is broken in the WTe1.42 thin film, which indicates that the carrier scattering induced by the disorder may suppress the charge compensation in the WTe2 sample with defects/dopants. To summarize, the discovery of disorder-induced linear magnetoresistance allows us to explain different magnetoresistance behaviors of WTe2. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-648X/ab8d74Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Condensed Matter
- Journal Volume
- 32
- Journal Issue
- 35
- Journal Page Range
- [7 p.]
- ISSN
- 0953-8984
- CODEN
- JCOMEL
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52060646
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CARRIER MOBILITY; DEFECTS; DOPED MATERIALS; ELECTRON-HOLE COUPLING; ENTROPY; MAGNETORESISTANCE; SCATTERING; SEMIMETALS; SPECTRA; TEMPERATURE RANGE 0065-0273 K; THIN FILMS; TUNGSTEN TELLURIDES
- Descriptors DEC
- CHALCOGENIDES; COUPLING; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELEMENTS; FILMS; MATERIALS; MOBILITY; PHYSICAL PROPERTIES; REFRACTORY METAL COMPOUNDS; TELLURIDES; TELLURIUM COMPOUNDS; TEMPERATURE RANGE; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT COMPOUNDS; TUNGSTEN COMPOUNDS