Published January 1, 2007
| Version v1
Journal article
Tests of monolithic active pixel sensors at national synchrotron light source
- 1. Brookhaven National Laboratory, Upton, NY 11973 (United States)
- 2. IPHC, CNRS-IN2P3/ULP, 23 rue du Loess, BP 28, 67037 Strasbourg cedex 02 (France)
Description
The paper discusses basic characterization of Monolithic Active Pixel Sensors (MAPS) carried out at the X12A beam-line at National Synchrotron Light Source (NSLS), Upton, NY, USA. The tested device was a MIMOSA V (MV) chip, back-thinned down to the epitaxial layer. This 1M pixels device features a pixel size of 17x17μm2 and was designed in a 0.6μm CMOS process. The X-ray beam energies used range from 5 to 12keV. Examples of direct X-ray imaging capabilities are presented
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2006.09.092;
- PII
- S0168-9002(06)01746-3;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 570
- Journal Issue
- 1
- Journal Page Range
- p. 165-170
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38038296
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BEAMS; DETECTION; EQUIPMENT; LAYERS; NSLS; RADIATION DETECTORS; SOFT X RADIATION; SYNCHROTRON RADIATION
- Descriptors DEC
- BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; RADIATION SOURCES; RADIATIONS; SYNCHROTRON RADIATION SOURCES; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.