Secondary processes in diffraction scattering of Moessbauer radiation

The secondary processes (conversion electrons, Auge-electrons and fluorescent X-ray radiation) following diffraction scattering of Moessbawer radiation are considered. Investigation of the output intensity of the secondary processes as a function of the incident angle of the initial Moessbauer radiation permits to study defects in the thin surface layer of the crystal in the Bragg geometry. In case of the Lane geometry the experiments of a new type with the suppression effects of inelastic channels of the nuclear reaction are possible