Published 2023 | Version v1
Miscellaneous

Analyzing Oxidation States of Metals: A Comparative Study of ED-RIXS and EXAFS Techniques

  • 1. FaMAF, Universidad Nacional de Córdoba (UNC), X5000HUA-Córdoba (Argentina)
  • 2. IFEG, National Scientific and Technical Research Council (CONICET), X5000HUA-Córdoba (Argentina)

Description

Spectrometric techniques based on X-ray absorption and scattering, such as EDIXS (Energy Dispersive Resonant Inelastic X-Ray Scattering) and EXAFS (Extended X-Ray Absorption Fine Structure), are powerful tools for determining the chemical and oxidation states of vanadium in various systems. These techniques can provide information on the local structure, coordination number, bond length and electronic configuration of vanadium atoms. Some examples of the use of these techniques are: the identification of V3S4, NiS and FeS as the main impurities in petroleum cokes for anodes used in aluminum production [2]; the investigation of the structure of vanadium oxide catalysts supported on silica and alumina [3]; the study of the semiconducting properties of vanadium phosphate glasses [4]; etc.

Part of:
The 6th International Hybrid Conference on X-ray Analysis. Book of Abstracts

Additional details

Publishing Information

ISBN
978-99929-53-93-4
Imprint Title
The 6th International Hybrid Conference on X-ray Analysis. Book of Abstracts
Imprint Pagination
87 p.
Journal Page Range
p. 80-81
Report number
INIS-MN--002

Conference

Title
6. International Conference on X-ray Analysis
Acronym
ICXRA-VI
Dates
28-30 Aug 2023
Place
Ulaanbaatar (Mongolia)

INIS

Country of Publication
Mongolia
Country of Input or Organization
Mongolia
INIS RN
54123990
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION; COMPARATIVE EVALUATIONS; FINE STRUCTURE; SCATTERING; VALENCE; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTRA; X-RAY SPECTROMETERS
Descriptors DEC
CHEMICAL ANALYSIS; EVALUATION; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; SORPTION; SPECTRA; SPECTROMETERS; X-RAY EMISSION ANALYSIS

Optional Information

Notes
4 refs.
Secondary number(s)
INIS-MN--002-44