Self-organization processes in semiconductor heterostructures
Creators
- 1. Institute of Condensed Matter Physics, Masaryk University, Brno (Czech Republic)
- 2. J. Kepler University, Linz (Austria)
Description
Processes of self-organization during the epitactic growth of semiconductor heteroepitaxial systems represent a promising way for the fabrication of semiconductor nano-structures such as quantum wires and quantum dots. Two types of the self-organization processes can be used, namely a bunching of monolayer steps at a growing vicinal surface (step-bunching process) and an elastic relaxation of mismatched pseudomorphically grown epitaxial layer during the Stranski-Krastanow growth mode. The former mechanism can produce self-organized one-dimensional quantum wires, while the latter one can yield a nearly periodic array of self-organized quantum dots. Self-organized semiconductor nano-structures in superlattices can be observed by surface-sensitive x-ray scattering. Grazing incidence small angle scattering (GISAXS) detects the shape and the positions of the nano-structures, while grazing incidence diffraction (GID) is sensitive to the elastic strains in the nano-structures and in the surrounding crystal matrix. Therefore, combining both methods we can investigate both the shape and chemical composition of buried nano-structures. (Authors)
Files
38059238.pdf
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Additional details
Identifiers
Publishing Information
- Publisher
- Institute of Physics, Slovak Academy of Sciences, VEDA
- Imprint Place
- Bratislava (Slovakia)
- Imprint Title
- 12. International conference on thin films (ICTF 12). Book of Abstract
- Imprint Pagination
- 182 p.
- Journal Page Range
- 1 p.
- Report number
- INIS-SK--2007-001
Conference
- Title
- 12. International conference on thin films
- Dates
- 15-20 Sep 2002
- Place
- Bratislava (Slovakia)
INIS
- Country of Publication
- Slovakia
- Country of Input or Organization
- Slovakia
- INIS RN
- 38059238
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYSTAL LATTICES; MICROSTRUCTURE; NANOSTRUCTURES; SEMICONDUCTOR MATERIALS; SMALL ANGLE SCATTERING; SOLIDS; THIN FILMS; X-RAY DIFFRACTION; X-RAY EQUIPMENT
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; EQUIPMENT; FILMS; MATERIALS; SCATTERING
Optional Information
- Notes
- p. PL15; E-mail: holy@physics.muni.cz