Published May 9, 2007 | Version v1
Journal article

The Surface Morphology Characterization of Electroless Nickel Immersion Gold Under Bump Metallurgy (UBM) Using SEM

  • 1. School of Microelectronic, Kolej Universiti Kejuruteraan Utara Malaysia (KUKUM), Blok A, Kompleks Pusat Pengajian KUKUM, Jalan Kangar-Arau, 02600 Jejawi, Perlis (Malaysia)

Description

This paper presents the surface morphology characterization at each process step in electroless nickel immersion gold (ENIG) deposition using Scanning Electron Microscope (SEM). The characterization start at initial bond pad, followed by cleaning, activation, first zincation, zinc removal, second zincation, electroless nickel and lastly immersion gold process. The result shows that the surface morphology of initial bond pad starts to change with deposition of zinc layer and further changes with deposition of nickel and gold layer

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
909
Journal Issue
1
Journal Page Range
p. 118-123
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
2. international conference on solid state science and technology 2006
Acronym
ICSSST 2006
Dates
4-6 Sep 2006
Place
Kuala Terengganu (Malaysia)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39076507
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COATINGS; CRYSTAL STRUCTURE; DEPOSITION; GOLD; LAYERS; MORPHOLOGY; NICKEL; SCANNING ELECTRON MICROSCOPY; SURFACES; ZINC
Descriptors DEC
ELECTRON MICROSCOPY; ELEMENTS; METALS; MICROSCOPY; TRANSITION ELEMENTS

Optional Information

Notes
(c) 2007 American Institute of Physics