Published May 9, 2007
| Version v1
Journal article
The Surface Morphology Characterization of Electroless Nickel Immersion Gold Under Bump Metallurgy (UBM) Using SEM
- 1. School of Microelectronic, Kolej Universiti Kejuruteraan Utara Malaysia (KUKUM), Blok A, Kompleks Pusat Pengajian KUKUM, Jalan Kangar-Arau, 02600 Jejawi, Perlis (Malaysia)
Description
This paper presents the surface morphology characterization at each process step in electroless nickel immersion gold (ENIG) deposition using Scanning Electron Microscope (SEM). The characterization start at initial bond pad, followed by cleaning, activation, first zincation, zinc removal, second zincation, electroless nickel and lastly immersion gold process. The result shows that the surface morphology of initial bond pad starts to change with deposition of zinc layer and further changes with deposition of nickel and gold layer
Additional details
Identifiers
- DOI
- 10.1063/1.2739836;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 909
- Journal Issue
- 1
- Journal Page Range
- p. 118-123
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 2. international conference on solid state science and technology 2006
- Acronym
- ICSSST 2006
- Dates
- 4-6 Sep 2006
- Place
- Kuala Terengganu (Malaysia)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39076507
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COATINGS; CRYSTAL STRUCTURE; DEPOSITION; GOLD; LAYERS; MORPHOLOGY; NICKEL; SCANNING ELECTRON MICROSCOPY; SURFACES; ZINC
- Descriptors DEC
- ELECTRON MICROSCOPY; ELEMENTS; METALS; MICROSCOPY; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2007 American Institute of Physics