Published November 15, 1988
| Version v1
Journal article
Pressure-induced changes in L/sub III/ x-ray-absorption near-edge structure of CeO2 and CeF4: Relevance to 4f-electronic structure
- 1. Institut fuer Atom- und Festkoerperphysik, Freie Universitaet Berlin, D-1000 Berlin 33, Germany
Description
X-ray-absorption near-edge structure (XANES) studies were performed at the L/sub III/ thresholds of CeO2 and CeF4 as a function of external pressure up to ≅267 kbar at room temperature. In both cases, the 4f0-related higher-energy component of the essentially double-peaked XANES structure decreases in relative intensity with pressure, opposite to what is generally observed for metallic mixed-valent Ce compounds. This supports the proposed peak assignment on the basis of core-hole induced many-body effects due to 4f-ligand covalency compatible with traditional tetravalency of these compounds
Additional details
Publishing Information
- Journal Title
- Physical Review, B: Condensed Matter
- Journal Volume
- 38
- Journal Issue
- 14
- Series
- Phys. Rev., B: Condens. Matter.
- Journal Page Range
- 10174-10177
- ISSN
- 0163-1829
- CODEN
- PRBMD
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 20015195
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION SPECTRA; CERIUM FLUORIDES; CERIUM OXIDES; ELECTRONIC STRUCTURE; MEDIUM TEMPERATURE; PRESSURE DEPENDENCE; VALENCE; VERY HIGH PRESSURE; X-RAY SPECTRA
- Descriptors DEC
- CERIUM COMPOUNDS; CHALCOGENIDES; FLUORIDES; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; RARE EARTH COMPOUNDS; SPECTRA