Published November 1, 2013
| Version v1
Journal article
Accuracy analysis of simplified and rigorous numerical methods applied to binary nanopatterning gratings in non-paraxial domain
Creators
- 1. Departamento de Física, Ingeniería de Sistemas y Teoría de la Señal, Universidad de Alicante, Crtra. San Vicente del Raspeig S/N, Alicante E-03080 (Spain)
- 2. Instituto Universitario de Física Aplicada a las Ciencias y las Tecnologías, Universidad de Alicante, Crtra. San Vicente del Raspeig S/N, Alicante E-03080 (Spain)
- 3. Departamento de Óptica, Farmacología y Anatomía, Universidad de Alicante, Crtra. San Vicente del Raspeig S/N, Alicante E-03080 (Spain)
Description
A set of simplified and rigorous electromagnetic vector theories is used for analyzing the transmittance characteristics of diffraction phase gratings. The scalar diffraction theory and the effective medium theory are validated with the exact results obtained via the rigorous coupled-wave theory and the finite-difference time-domain method. The effects of surface profile parameters and also the angle of incidence is demonstrated to be a limiting factor in the accuracy of these theories. Therefore, the error of both simplified theories is also analyzed in non-paraxial domain with the intention of establishing a specific range of validity for both simplified theories.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physleta.2013.05.059Additional details
Identifiers
- DOI
- 10.1016/j.physleta.2013.05.059;
- PII
- S0375-9601(13)00600-2;
Publishing Information
- Journal Title
- Physics Letters. A
- Journal Volume
- 377
- Journal Issue
- 34-36
- Journal Page Range
- p. 2245-2250
- ISSN
- 0375-9601
- CODEN
- PYLAAG
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46008980
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ACCURACY; COMPARATIVE EVALUATIONS; DIFFRACTION; DIFFRACTION GRATINGS; EFFICIENCY; INCIDENCE ANGLE; OPTICS; SURFACES
- Descriptors DEC
- COHERENT SCATTERING; EVALUATION; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.