Published November 1, 2013 | Version v1
Journal article

Accuracy analysis of simplified and rigorous numerical methods applied to binary nanopatterning gratings in non-paraxial domain

  • 1. Departamento de Física, Ingeniería de Sistemas y Teoría de la Señal, Universidad de Alicante, Crtra. San Vicente del Raspeig S/N, Alicante E-03080 (Spain)
  • 2. Instituto Universitario de Física Aplicada a las Ciencias y las Tecnologías, Universidad de Alicante, Crtra. San Vicente del Raspeig S/N, Alicante E-03080 (Spain)
  • 3. Departamento de Óptica, Farmacología y Anatomía, Universidad de Alicante, Crtra. San Vicente del Raspeig S/N, Alicante E-03080 (Spain)

Description

A set of simplified and rigorous electromagnetic vector theories is used for analyzing the transmittance characteristics of diffraction phase gratings. The scalar diffraction theory and the effective medium theory are validated with the exact results obtained via the rigorous coupled-wave theory and the finite-difference time-domain method. The effects of surface profile parameters and also the angle of incidence is demonstrated to be a limiting factor in the accuracy of these theories. Therefore, the error of both simplified theories is also analyzed in non-paraxial domain with the intention of establishing a specific range of validity for both simplified theories.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physleta.2013.05.059

Additional details

Identifiers

DOI
10.1016/j.physleta.2013.05.059;
PII
S0375-9601(13)00600-2;

Publishing Information

Journal Title
Physics Letters. A
Journal Volume
377
Journal Issue
34-36
Journal Page Range
p. 2245-2250
ISSN
0375-9601
CODEN
PYLAAG

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46008980
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
ACCURACY; COMPARATIVE EVALUATIONS; DIFFRACTION; DIFFRACTION GRATINGS; EFFICIENCY; INCIDENCE ANGLE; OPTICS; SURFACES
Descriptors DEC
COHERENT SCATTERING; EVALUATION; SCATTERING

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.