Published November 1994 | Version v1
Journal article

Simple and complex double-strand breaks induced by electrons

  • 1. Ceskoslovenska Akademie Ved, Prague (Czech Republic). Ustav Radiologicke Dozimetrie
  • 2. Centre de Biophysique Moleculaire, 45 Orleans (France)
  • 3. Goettingen Univ. (Germany). Abt. fuer Strahlenphysik und Strahlenbiologie

Description

Biophysical modelling of DNA damage based on Monte Carlo simulation of charged particle tracks allows to describe radiation induced double-strand breaks (dsb) in a quantitative and qualitative way. Experimental and calculated data suggest that in the electron energy range from 50 eV to 1 MeV dsb can be grouped in simple and complex dsb. Complex dsb are mainly produced by low energy electrons with initial energies between ∼ 200 and ∼ 500 eV, whereas simple dsb are preferentially induced by energy transfers <200 eV, which produce at least two ionizations. (Author)

Additional details

Publishing Information

Journal Title
International Journal of Radiation Biology
Journal Volume
66
Journal Issue
5
Journal Page Range
p. 467-470.
ISSN
0955-3002
CODEN
IJRBE7

Conference

Title
radiation damage in DNA: physics, chemistry and molecular biology.
Acronym
18. L.H. Gray conference
Dates
10-14 Apr 1994.
Place
Bath (United Kingdom).